| 万能工具显微镜计算机辅助测量与处理系统 |
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| 引用本文： | 蒲红,韩涛. 万能工具显微镜计算机辅助测量与处理系统[J]. 机械工程师, 2003, 0(3): 20-21 |
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| 作者姓名： | 蒲红 韩涛 |
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| 作者单位： | 佳木斯大学,机械工程学院,黑龙江,佳木斯,154007 |
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| 摘 要： | 介绍了一种自行开发的万能工具显微镜计算机辅助测量与处理系统。该系统提高了测量精度和运算速度，增强了原有设备的功能，使测量过程自动化。
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| 关 键 词： | 测量精度 运算速度 接口电路 |
| 文章编号： | 1002-2333(2003)03-0020-02 |
| 修稿时间： | 2003-01-09 |
Computer-Aided Measuring And Processing System Of Universal Measuring Microscope |
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| PU Hong,HAN Tao. Computer-Aided Measuring And Processing System Of Universal Measuring Microscope[J]. Mechanical Engineer, 2003, 0(3): 20-21 |
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| Authors: | PU Hong HAN Tao |
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| Abstract: | We analyze a self-developing computer-aided measuring and processing system of universal measuring microscope.Being equipped with sensors and computer,this system has improved measurement accuracy and run -speed,enhanced the facilities of original equipment and made the process of measurement automatic. |
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| Keywords: | measurement accuracy run-speed interface circuit |
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