Methods for Estimating Theoretically the Influence of Ion Scattering and Reflection on the Isotopic Sensitivity of Static Magnetic Mass-Spectrometers

For purposes of optimizing ion-optical systems, analyzer construction, and pump placement in static magnetic mass-spectrometers for isotopic analysis of uranium compounds, a comparative analysis is made and a review is given of methods described in the literature for theoretical estimates of the influence of scattering and reflection of ions on the isotopic sensitivity. Conclusions which make it possible to solve the problem are drawn.