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SDL- and MSC-Based Specification and Automated Test Case Generation for INAP |
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| Authors: | Grabowski Jens Hogrefe Dieter |
| Affiliation: | (1) Institute for Telematics, University of Lübeck, Ratzeburger Allee 160, D-23538 Lübeck, Germany |
| Abstract: | |
| Keywords: | SDL MSC TTCN ASN 1 conformance testing automatic test generation standardization ETSI ITU-T |
| 本文献已被 SpringerLink 等数据库收录！ | |