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电感耦合等离子体原子发射光谱法测定氧化钒中钾钠硫磷铁
引用本文:冯宗平.电感耦合等离子体原子发射光谱法测定氧化钒中钾钠硫磷铁[J].冶金分析,2010,30(3):30-33.
作者姓名:冯宗平
作者单位:攀枝花钢钒有限公司技术质量部;
摘    要:样品经盐酸(1+1)和硝酸(1+1)分解后,采用电感耦合等离子体原子发射光谱法(ICP-AES)测定三氧化二钒和五氧化二钒中钾、钠、磷、硫、铁杂质元素的含量。采用基体匹配消除主量元素钒对杂质元素的干扰,优化了测定工作条件,确定钾、钠、磷、硫、铁的分析谱线分别为766.490 nm、589.592 nm、178.284 nm、182.034 nm、259.940 nm。测定氧化钾、氧化钠、磷、硫、铁的检出限分别为0.020 mg/L、0.012 mg/L、0.008 mg/L、0.010 mg/L、0.002 mg/L。方法用于标准样品和实际样品的分析,测定结果分别同认定值及其他方法的测定结果相吻合,相对标准偏差(n=11)为0.54%~4.0%。

关 键 词:电感耦合等离子体原子发射光谱法  氧化钒            

Determination of potassium, sodium, phosphorus, sulfur and iron in vanadium oxide by inductively coupled plasma atomic emission spectrometry
Abstract:The samples were dissolved in hydrochloric acid(1+1) and nitric acid(1+1). The impure elements in vanadium trioxide and vanadium pentoxide including potassium, sodium, phosphorus, sul-fur and iron were determined by inductively coupled plasma atomic emission spectrometry (ICP-AES). The effects of vanadium could be eliminated by matrix matching. The working conditions were opti-mized. The analytical line were determined:K 766. 490 nm;Na,589. 592 nm;P,178. 284 nm;S,182. 034 nm;Fe, 259. 940 nm. The determination results of standard samples and actual samples were in good agreement with the certified values and those obtained by other methods. The relative standard devia-tion(n=11) was 0.54%-4.0%.
Keywords:inductively coupled plasma atomic emission spectrometry  vanadium oxide  potassium  so-dium  phosphorus  sulfur  iron
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