Armament Development Authority, Israel Ministry of Defence, P.O. Box 7063, Tel Aviv, Israel
Abstract:
A duplex-film model for barrier anodic films on aluminium is suggested, the lower layer being homogeneous and amorphous and the upper consisting of a dispersion of a crystalline phase in an amorphous matrix. From impedance measurements over a range of frequencies, the dielectric constants of the layers are estimated as 12 and 9 respectively.