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Comparison between PIXE and XRF for applications in art and archaeology |
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| Affiliation: | 1. Faculty of Electrical Engineering, Bialystok University of Technology, 45D Wiejska Street, 15-351 Bialystok, Poland;2. Faculty of Mechanical Engineering, Bialystok University of Technology, 45D Wiejska Street, 15-351 Bialystok, Poland;3. Institute of Chemistry, University of Silesia, 9 Szkolna Street, 40-007 Katowice, Poland,;4. Faculty of Materials Science and Ceramics, AGH University of Science and Technology, 30 Mickiewicza Av., 30-059 Krakow, Poland |
| Abstract: | The properties of X-ray fluorescence and particle-induced X-ray emission have been compared with special reference to applications within art and archaeology. The two techniques have each been found to have several specific merits useful in the analysis of various objects in these fields. Together they offer the museum scientist and archaeologist excellent complementary analytical tools for nondestructive multielemental analysis. |
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