Electrical properties of thin oxidized aluminium films |
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Authors: | F. M. Reicha M. A. El Hiti P. B. Barna |
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Affiliation: | (1) Department of Physics, Faculty of Science, Mansura University, Mansura, Egypt;(2) Department of Physics, Faculty of Science, Tanta University, Tanta, Egypt;(3) Research Institute for Technical Physics HAS, PO Box 76, H-1325 Budapest, Hungary |
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Abstract: | Thin aluminium films of thickness 40 to 200 nm were deposited on to glass substrates at 573 K in a high vacuum. The deposition was carried out layer by layer and the interfaces between these layers were exposed to oxygen. The electrical resistivity was studied as a function of the film thickness, annealing time, annealing temperature and oxygen pressure. The temperature coefficient of resistivity and the activation energy for the conduction electrons were studied as a function of the film thickness and oxygen pressure. Fuchs-Sondheimer theory for electrical conduction was applied to the experimental results. The mean free path of the conduction electrons was calculated as a function of temperature and agreed well with the theoretical relation. |
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