Mapping Energy Levels for Organic Heterojunctions

An organic semiconductor thin film is a solid‐state matter comprising one or more molecules. For applications in electronics and photonics, several distinct functional organic thin films are stacked together to create a variety of devices such as organic light‐emitting diodes and organic solar cells. The energy levels at these thin‐film junctions dictate various electronic processes such as the charge transport across these junctions, the exciton dissociation rates at donor–acceptor molecular interfaces, and the charge trapping during exciton formation in a host–dopant system. These electronic processes are vital to a device's performance and functionality. To uncover a general scientific principle in governing the interface energy levels, highest occupied molecular orbitals, and vacuum level dipoles, herein a comprehensive experimental research is conducted on several dozens of organic–organic heterojunctions representative of various device applications. It is found that the experimental data map on interface energy levels, after correcting variables such as molecular orientation‐dependent ionization energies, consists of three distinct regions depending on interface fundamental physical parameters such as Fermi energy, work function, highest occupied molecular orbitals, and lowest unoccupied molecular orbitals. This general energy map provides a master guide in selection of new materials for fabricating future generations of organic semiconductor devices.