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GaAs多功能MMIC在片测试系统设计
引用本文:陈金远,焦芳,王逸铭,林罡.GaAs多功能MMIC在片测试系统设计[J].电子与封装,2021,21(3).
作者姓名:陈金远  焦芳  王逸铭  林罡
作者单位:南京电子器件研究所,南京210016
摘    要:GaAs多功能MMIC集成度高,数模混合驱动及测试需求考验测试平台的兼容性和稳定性。采用PXI平台模块化测试仪器结合矢量网络分析仪设计多功能MMIC在片测试系统,满足GaAs多功能MMIC的数模混合信号驱动、检测需求,保证测试稳定性。

关 键 词:多功能MMIC  PXI  逻辑电路  模块化仪器

Design of GaAs Multi-Function MMIC On-Wafer Test System
CHEN Jinyuan,JIAO Fang,WANG Yiming,LIN Gang.Design of GaAs Multi-Function MMIC On-Wafer Test System[J].Electronics & Packaging,2021,21(3).
Authors:CHEN Jinyuan  JIAO Fang  WANG Yiming  LIN Gang
Affiliation:(Nanjing Electronic Device Institute,Nanjing 210016,China)
Abstract:GaAs multi-function MMIC is highly integrated.The test compatibility and stability of the test platform are required by mixed digital and analog drive and test requirements.The multi-function MMIC test system is designed by using PXI platform modular test instrument and vector network analyzer to meet the demand of mixed signal driving and detection of multi-function MMIC,ensure the stability of test.
Keywords:multi-function MMIC(MFC)  PXI  logic circuit  modular test instrument
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