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一种面向设计寿命全过程的电子系统可靠性分配法
引用本文:尤明懿.一种面向设计寿命全过程的电子系统可靠性分配法[J].电子产品可靠性与环境试验,2012(1):32-36.
作者姓名:尤明懿
作者单位:[1]上海交通大学机械系统与振动国家重点实验室,上海200240 [2]中国电子科技集团公司第三十六研究所,浙江嘉兴314033
摘    要:提出一种基于等分配法的、面向各单元设计寿命全过程的电子系统可靠性分配法。该方法在保证满足系统设计寿命末可靠性指标的前提下,使各单元在设计寿命过程中各个时期的可靠度接近,从而避免出现可靠度显著地低于其它单元的"短板"单元。基于某"软件星"有效载荷的算例,演示了所提出的可靠性分配法的应用流程,比较了该方法与传统等分配法的分配结果。

关 键 词:可靠性分配  等分配法  设计寿命全过程

A Designed Lifetime Process Centered Reliability Allocation Method for Electronic Systems
YOU Ming-Yi.A Designed Lifetime Process Centered Reliability Allocation Method for Electronic Systems[J].Electronic Product Reliability and Environmental Testing,2012(1):32-36.
Authors:YOU Ming-Yi
Affiliation:YOU Ming-Yi1,2(1.State Key Laboratory of Mechanical System and Vibration,Shanghai Jiao Tong Unirersity Shanghai 200240,China;2.No.36 Research Institute of CETC,Jiaxing,314033,China)
Abstract:In this study,a designed lifetime process centered reliability allocation method is proposed for electronic systems based on the equal allocation method.The proposed method tends to make the reliability of each unit close in all phases of the system's designed lifetime,under the premise that the system reliability index is met.The proposed method tends to avoid the "weak point"unit in all phases of the system's designed lifetime,whose reliability is significantly lower than those of others.With a numerical example of a payload system of a software satellite,the implementation procedures of the proposed method is illustrated,and the allocation results by the proposed method are compared with those of the traditional equal allocation method.
Keywords:reliability allocation  equal allocation method  entire lifetime process
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