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The AES and micro-raman characteristics of diamond thin films grown by EACVD as the nucleation free energy increases |
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| Authors: | C. R. Lee J. Y. Leem B. S. Chun |
| Affiliation: | (1) Electronic Thin Film Science Lab, Material Evaluation Center, Korea Research Institute of Standards and Science, Taeduck Science Town, Taejon, Korea;(2) RASOM, Engineering college, Chungnam National University, Taeduck Science Town, Taejon, Korea |
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