Comparative study of shunted bicrystal Josephson junctions |
| |
Authors: | Alexander Klushin Alexander Golubov Werner Prusseit Hermann Kohlstedt |
| |
Affiliation: | 1. Institute of Electronic Measurements “KVARZ”, 603009, Nizhnii Novgorod, Russia 2. Institut für Schicht- und Ionentechnik, Forschungszentrum Jülich GmbH, 52425, Jülich, Germany
|
| |
Abstract: | In order to optimize the series array performance of Y Ba2Cu3O7−x (YBCO) grain boundary shunted junctions, a method to determine and control the junction resistance Rs and Au/YBCO contact resistivity ρ c has been developed. 200 nm thick c-oriented YBCO films were grown by intermittent thermal coevaporation on bicrystal yttria-stabilized zirconia substrates. A gold contact overlayer of thickness dn was deposited in situ. Normal junction resistances have been measured as a function of dn and shunt width w. It was shown that, in accordance with theoretical estimates, the junction shunt resistance is essentially controlled by the c-axis Au/YBCO interface specific resistance and scales as . The product ρ c ρ n ≃ 3.10−14 Ω2 cm 3 was estimated from the experimental data, leading to ρ c ≈ 10−8 Ωcm 2 for typical values of ρ n for gold thin films. |
| |
Keywords: | |
本文献已被 SpringerLink 等数据库收录! |
|