Comparative study of shunted bicrystal Josephson junctions |
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Authors: | Alexander Klushin Alexander Golubov Werner Prusseit Hermann Kohlstedt |
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Affiliation: | 1. Institute of Electronic Measurements “KVARZ”, 603009, Nizhnii Novgorod, Russia 2. Institut für Schicht- und Ionentechnik, Forschungszentrum Jülich GmbH, 52425, Jülich, Germany
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Abstract: | In order to optimize the series array performance of Y Ba2Cu3O7−x (YBCO) grain boundary shunted junctions, a method to determine and control the junction resistance Rs and Au/YBCO contact resistivity ρ
c
has been developed. 200 nm thick c-oriented YBCO films were grown by intermittent thermal coevaporation on bicrystal yttria-stabilized
zirconia substrates. A gold contact overlayer of thickness dn was deposited in situ. Normal junction resistances have been measured as a function of dn and shunt width w. It was shown that, in accordance with theoretical estimates, the junction shunt resistance is essentially
controlled by the c-axis Au/YBCO interface specific resistance and scales as
. The product ρ
c
ρ
n
≃ 3.10−14 Ω2
cm
3 was estimated from the experimental data, leading to ρ
c
≈ 10−8 Ωcm
2 for typical values of ρ
n
for gold thin films. |
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Keywords: | |
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