| 功率MOSFET辐射效应动态测试系统研制 |
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| 引用本文： | 刘保录,赵又新.功率MOSFET辐射效应动态测试系统研制[J].兰州工业高等专科学校学报,2003,10(1):4-7. |
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| 作者姓名： | 刘保录 赵又新 |
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| 作者单位： | 兰州工业高等专科学校,电气工程系,甘肃,兰州,730050 |
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| 摘 要： | 介绍一种基于计算机控制，运用于MOSFET单粒子效应动态测试的便携式仪器。它能对MOSFET在不烧毁情况下进行反复测试，捕捉其烧毁电流脉冲，并可以通过计算机对MOSFET的栅源电压进行连续调节，对漏源过电流保护。论述了测试系统的结构，MOSFET测试电路，电流脉冲的捕捉、计数方法，高共模隔离放大电路等软、硬件设计。
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| 关 键 词： | 单粒子效应 电流脉冲 动态测试 栅源电压 漏源电压 卫星 抗辐射加固 |
| 文章编号： | 1009-2269(2003)01-0004-04 |
| 修稿时间： | 2002年11月28 |
Development of Power MOSFET Radiating Effect Test System |
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| LIU Bao-lu,ZHAO You-xin.Development of Power MOSFET Radiating Effect Test System[J].Journal of Lanzhou Higher Polytechnical College,2003,10(1):4-7. |
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| Authors: | LIU Bao-lu ZHAO You-xin |
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| Abstract: | This paper introduces a portable instrument based on computer control which can implement in MOSFET single ions effect dynamic test ,and which can also test burnout current pulse without destructive MOSFET. This instrument can adjust gate-source voltage continuously and protect it from drain-source over-current by computer,too.The paper also deals with structure of the measure system, measure circuit of MOSFET methods of capture and counting current pulse, high common-mode isolating magnify circuit and design of software and hardware. |
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| Keywords: | MOSFET single ions effect current pulse dynamic test |
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