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基于任意波形发生器的高压短路试验测量系统校准方法和装置的研究
引用本文:周小猛,林志力,苗本健.基于任意波形发生器的高压短路试验测量系统校准方法和装置的研究[J].计量学报,2020,41(4):494-499.
作者姓名:周小猛  林志力  苗本健
作者单位:1.国家智能电网输配电设备质量监督检验中心,广东 东莞 523325
2.广东产品质量监督检验研究院, 广东 广州 510670
基金项目:广东省质监局科技项目;国家质检总局科技计划项目
摘    要:提出了一种将标准短路试验波形注入多通道任意波形发生器,来产生模拟实际的校准波形,进而对测量系统进行校准的方法。校准装置使用现场可编程门阵列(FPGA)、直接数字频率合成器(DDS)等器件。对装置的检定结果表明:在10 Hz^200 kHz频率范围内,输出频率、输出电压最大误差分别为2.1×10^-6、3×10^-3。重复输出10次,输出幅值的最大相对标准偏差为5.7×10^-4,1年内幅值变化的最大相对标准偏差为1.9×10^-4。通过将该装置用于实际高压短路试验测试系统的校准,验证了试验波形的噪声、零漂及带宽均会对测量系统的准确度产生显著影响。

关 键 词:计量学  高压短路试验  校准  任意波形发生器
收稿时间:2019-08-20

Research on Calibration Method and Device of High Voltage Short-circuit Test Measuring System Based on Arbitrary Waveform Generator
ZHOU Xiao-meng,LIN Zhi-li,MIAO Ben-jian.Research on Calibration Method and Device of High Voltage Short-circuit Test Measuring System Based on Arbitrary Waveform Generator[J].Acta Metrologica Sinica,2020,41(4):494-499.
Authors:ZHOU Xiao-meng  LIN Zhi-li  MIAO Ben-jian
Affiliation:1.China National Quality Supervision and Testing Center for Smart Grid Transmission and Distribution Equipment, Dongguan, Guangdong 523325, China
2.Guangdong Testing Institute of Product Quality Supervision, Guangzhou, Guangdong 510330, China
Abstract:A method for injecting standard short-circuit test waveforms into a multi-channel arbitrary waveform generator to generate simulated actual calibration waveforms and then calibrating the measuring systems was proposed. A calibration device were developed using devices such as field programmable gate array (FPGA) and direct digital synthesizer (DDS). The verification results of the calibration device show that the maximum error of the output frequency and output voltage are 2.1×10-6 and 3×10-3 in the frequency range of 10Hz~200kHz. Repeated output 10 times, the maximum relative standard deviation of the output amplitude is 5.7×10-4, and the maximum relative standard deviation of the amplitude change within 1 year is 1.9×10-4. By using the device for calibration of the actual high voltage short-circuit test measuring system, it is verified that the noise, zero drift and bandwidth of the test waveform have a significant impact on the accuracy of the measuring system.
Keywords:metrology  high voltage short-circuit test  calibration  arbitrary waveform generator  
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