Femtosecond near-field scanning optical microscopy study of molecular thin films |
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| Authors: | H. Kawashima,M. Furuki&dagger ,&Dagger ,S. Tatsuura&dagger ,M. Tian&Dagger ,Y. Sato&Dagger ,L. S. Pu&Dagger ,& T. Tani§ |
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| Affiliation: | Electrotechnical Laboratory, Tsukuba, Ibaraki 305-8568, Japan;The Femtosecond Technology Research Association, Tsukuba, Ibaraki 305-2635, Japan;Corporate Research Center, Fuji Xerox Co. Ltd, Nakaimachi, Kanagawa 259-0157, Japan;Department of Applied Physics, Tokyo University of Agriculture &Technology, Koganei, Tokyo 184-8588, Japan |
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| Abstract: | A near-field scanning optical microscope has been combined with a two-colour time-resolved pump-probe measurement system. It has a noise-equivalent transmittance change of 5.0 × 10−5 for a probe pulse with an intensity of 30 nW. The system has been used for evaluating molecular thin films that have a domain structure, particularly for observing a gate action of the single domains. The results include key features to understand an origin of the domains and suggest that the film composition is uniform over a distance of several micrometres. |
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| Keywords: | Femtosecond time-resolved measurement near-field optics near-field scanning optical microscopy. |
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