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基于IEEE1149.4的混合信号边界扫描测试控制器设计
引用本文:张西多,易晓山,胡政. 基于IEEE1149.4的混合信号边界扫描测试控制器设计[J]. 计算机测量与控制, 2006, 14(5): 570-572
作者姓名:张西多  易晓山  胡政
作者单位:国防科学技术大学,机电工程研究所,湖南,长沙,410073;国防科学技术大学,机电工程研究所,湖南,长沙,410073;国防科学技术大学,机电工程研究所,湖南,长沙,410073
摘    要:简要介绍了IEEE1149.4混合信号测试总线及其特点,并根据该标准定义的测试结构对混合信号电路的测试方法进行研究,设计出符合IEEE1149.4标准的边界扫描控制器及其验证电路,实验结果表明该测试控制器能实现对混合信号电路板的测试,大大提高了混合信号电路板的可观性和可控性.

关 键 词:边界扫描  可测试性  IEEE1149.4
文章编号:1671-4598(2006)05-0570-03
收稿时间:2005-05-03
修稿时间:2005-08-10

Design of Mixed-signal Boundary-scan Test Controller Based on IEEE1149.4
Zhang Xiduo,Yi Xiaoshan,Hu Zheng. Design of Mixed-signal Boundary-scan Test Controller Based on IEEE1149.4[J]. Computer Measurement & Control, 2006, 14(5): 570-572
Authors:Zhang Xiduo  Yi Xiaoshan  Hu Zheng
Affiliation:College of Mechatronics Engineering and Automation, National Univ. of Defense Technology, Changsha 410073, China
Abstract:IEEE1149. 4 standard and mixed-signal test bus were introduced firstly. Then according to the test structure defined in this standard, test methods on mixed-signal circuit were researched, and a boundary-scan controller and demo circuit PCB were designed. Finally, experimental results indicate that the boundary-scan controller is feasible to the test of mixed-signal circuits, and greatly improves observability and controllability of mixed-signal PCB.
Keywords:IEEE1149.4
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