High-frequency dielectric properties of Mg-Al-Si,Ca-Al-Si and Y-Al-Si oxynitride glasses

Recently developed coaxial line techniques 1] have been used to determine, at room temperature, the values of the real () and imaginary (') parts of the dielectric constants for some Mg-Al-Si, Ca-Al-Si and Y-Al-Si oxynitride glasses over the frequency range 500 MHz to 5 GHz. The frequency dependencies of and ' are consistent with the universal law of dielectric response in that (-_t8)^(n–1) and '^(n–1) for all glass compositions; the high experimental value of the exponent (n=1.0±0.1) suggests the limiting form of lattice loss 2] situation. In this frequency range, as previously reported 3] at longer wavelengths, the addition of nitrogen increases the dielectric constant, (); in both the oxide and oxynitride glasses is also influenced by the cation, being increased with cation type in the order magnesium, yttrium, calcium as at lower frequencies.