Analyses and techniques for phase noise reduction in CMOS Colpitts oscillator topology

This paper reports the analyses of three techniques for phase noise reduction in the complementary metal‐oxide semiconductor (CMOS) Colpitts oscillator circuit topology. Namely, the three techniques are inductive degeneration, noise filter, and optimum current density. The design of the circuit topology is carried out in 28‐nm bulk CMOS technology. The analytical expression of the oscillation frequency is derived and validated through circuit simulations. Moreover, the theoretical analyses of the three techniques are carried out and verified by means of circuit simulations within a commercial design environment. The results obtained for the inductive degeneration and noise filter show the existence of an optimum inductance for minimum phase noise. The results obtained for the optimum bias current density technique applied to a Colpitts oscillator circuit topology incorporating either inductive degeneration or noise filter show the existence of an optimum bias current density for minimum phase noise. Overall, the analyses show that the adoption of these techniques may lead to a potential phase noise reduction up to 19 dB at a 1‐MHz frequency offset for an oscillation frequency of 10 GHz. © 2015 The Authors International Journal of Circuit Theory and Applications Published by John Wiley & Sons Ltd.