| 网络法测量光电导欧姆接触电阻的技术与分析 |
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| 引用本文： | 顾冠清,支婷婷,陈兰荣. 网络法测量光电导欧姆接触电阻的技术与分析[J]. 应用激光, 1991, 0(3) |
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| 作者姓名： | 顾冠清 支婷婷 陈兰荣 |
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| 作者单位： | 中国科学院上海光机所，中国科学院上海光机所，中国科学院上海光机所 |
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| 摘 要： | 给出了高电阻率光电导体在受力情况下欧姆接触咀阻的测量技术。分别不用 Si(ρ≈3×10~4Ω·cm)及 Cr:GaAs(ρ≈10~8Ω·cm)晶体测量其铟(In)欧姆接触电阻值,并对该方法测量精度进行了分析。
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| 关 键 词： | 光电导 欧姆接触电阻 |
Technique and Analysis for Measuring Contact Resistance of an Ohmic Contact Applied to Photoconductors by a Network |
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| Gu Guanqing Zhi Tingting Chen Lanrong. Technique and Analysis for Measuring Contact Resistance of an Ohmic Contact Applied to Photoconductors by a Network[J]. Applied Laser, 1991, 0(3) |
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| Authors: | Gu Guanqing Zhi Tingting Chen Lanrong |
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| Affiliation: | Gu Guanqing Zhi Tingting Chen Lanrong Shanghai Institute of Optics And Fine Mechanics,Academic Sinica |
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| Abstract: | |
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| Keywords: | Photoconductor ohmic contact resistance |
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