| 测试总线发展的回顾与展望 |
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| 引用本文： | 郭恩全,苗胜. 测试总线发展的回顾与展望[J]. 电子测量与仪器学报, 2009, 23(8): 1-6 |
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| 作者姓名： | 郭恩全 苗胜 |
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| 作者单位： | 陕西海泰电子有限责任公司,西安,710075;陕西海泰电子有限责任公司,西安,710075 |
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| 摘 要： | 测试总线技术是支撑自动化测试系统发展的核心技术。从20世纪70年代第一代测试总线GPIB诞生以来，已陆续产生了VXI、PXI和LXI等多种测试总线标准。本文通过对测试总线发展历程的回顾，重点分析了新一代测试总线LXI的特点及应用，并展望了测试总线在未来的发展。
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| 关 键 词： | 测试总线 自动化测试系统 GPIB VXI PXI LXI |
Review and prospect on development of test bus |
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| Guo Enquan,Miao Sheng. Review and prospect on development of test bus[J]. Journal of Electronic Measurement and Instrument, 2009, 23(8): 1-6 |
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| Authors: | Guo Enquan Miao Sheng |
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| Affiliation: | Shaanxi Hitech.Electronic Co.Ltd.;Xi'an 710075;China |
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| Abstract: | Test bus technology is the core of development of automatic test system(ATS).Since GPIB,the first generation of test bus,was invented in 1970s,several other criterions such as:VXI,PXI and LXI were researched already.After review the development of test bus,more emphases were put on analyzing the characteristics and applications of LXI.Finally,some prospects on the development in the future of test bus were proposed. |
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| Keywords: | Test Bus GPIB ATS VXI PXI LXI |
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