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Durability of a niobium thin film for bipolar plates in PEMFC |
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| Authors: | Jun-Ho KimDong-Won Jung SunKwang KimSungTae Hong YongZoo YouDaeil Kim |
| Affiliation: | a Ulsan Fine Chemical Industry Center, Ulsan Technopark, Ulsan 681-340, Republic of Korea b School of Chemical Engineering & Bioengineering, University of Ulsan, Ulsan 680-749, Republic of Korea c School of Materials Science and Engineering, University of Ulsan, San 29, Mugeo-Dong, Nam-Gu, Ulsan 680-749, Republic of Korea d School of Mechanical Engineering, University of Ulsan, Ulsan 680-749, Republic of Korea |
| Abstract: | The durability of a niobium (Nb) thin film deposited on AISI 316L by magnetron sputtering was investigated in simulated polymer electrolyte membrane fuel cell (PEMFC) environments. The result of a potentiostatic test in a simulated corrosion environment showed that the current densities of the cathode and anode were 1.56 × 10−7 and -7.2 × 10−7 A/cm2, respectively.Before and after the potentiostatic test, the value of the interfacial contact resistance (ICR) increased 40.1 mΩ cm2 at 1.5 MPa. The cell performance observed with the Nb-bipolar plate (BP) was slightly decreased compared to the commercial graphite-BP over this test period. After a 300 h durability test, cell performance of the Nb-BP unit cell was slightly decreased by 5.4% at a current density of 400 mA/cm2. |
| Keywords: | Nb PEMFC Magnetron sputtering Durability Potentiostatic test |
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