| 一个有效的不完全Scan结构MOS电路的测试生成算法 |
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| 引用本文： | 石志钢 林争辉. 一个有效的不完全Scan结构MOS电路的测试生成算法[J]. 计算机辅助设计与图形学学报, 1993, 5(3): 195-203 |
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| 作者姓名： | 石志钢 林争辉 |
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| 作者单位： | 上海交通大学LSI研究所，上海交通大学LSI研究所 上海，200030，上海，200030 工学哲学博士，上海交大大规模集成电路研究所所长，教授 |
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| 摘 要： | 本文介绍一个不完全Scan结构MOS电路的测试生成算法DALG—EX18。该算法充分考虑不完全Scan结构的特点,同时也考虑MOS电路中由三态器件引出的一些特性,在传统5值D-算法基础上,引入18值及其计算规则,加入新的处理步骤,并辅以可观值/可控值引导D-驱赶和一致性操作,从而提高故障覆盖率,加快测试生成速度。DALG—EX18算法已用C语言在VAX 11/750机上实现,一些电路的实验结果表明,该算法是有效的。
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| 关 键 词： | 测试生成 D－算法 Scan结构 MOS电路 |
AN EFFICIENT ALGORITHM OF TEST PATTERN GENERATION FOR MOS CIRCUITS WITH INCOMPLETE SCAN STRUCTURE |
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| Shi Zhigang Lin Zhenghui LSI Research Institute. AN EFFICIENT ALGORITHM OF TEST PATTERN GENERATION FOR MOS CIRCUITS WITH INCOMPLETE SCAN STRUCTURE[J]. Journal of Computer-Aided Design & Computer Graphics, 1993, 5(3): 195-203 |
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| Authors: | Shi Zhigang Lin Zhenghui LSI Research Institute |
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| Affiliation: | Shi Zhigang Lin Zhenghui LSI Research Institute. Shanghai Jiaotong University,Shanghai. 200030 |
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| Abstract: | This paper describes a deterministic test generation algorithm-DALG -EX18for MOS circuits with incomplete scan structure. This algorithm considers features of the circuits with incomplete scan structure, and also problems caused by high impedance state in MOS circuits. In the algorithm, 18-value D-calculus and new processing procedures are developed on the basis of traditional 5-valued D-algorithm. Additionally, testability measure is used to guide a d-drive and a consistency. Test generation, thus, can be speeded up and fault coverage can be rised. C program of this algorithm is implemented on VAX 11/ 750 and running results for some circuits are shown in the paper. |
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| Keywords: | Test generation. D-algorithm scan structure MOS circuits. |
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