Syndrome and transition count are uncorrelated [logic circuittesting] |
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Authors: | Saxena N.R. Robinson J.P. |
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Affiliation: | Hewlett-Packard, Cupertino, CA; |
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Abstract: | In the testing of logic circuits, two proposed data-compression methods use the number of ones (syndrome) and the number of sequence changes (transition count). An enumeration N(m, k , t) of the number of length-m binary sequences having syndrome value k and transition count t is developed. Examination of this result reveals that the parallel compression of these two methods has small overlap in error masking. An asymptotic expression for N(m, k, t) is developed |
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