Noninterfering optical method of HBT circuit evaluation |
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Authors: | Wang K.C. Asbeck P.M. Chang M.F. Sullivan G.J. Miller D.L. Basit H.F. |
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Affiliation: | Rockwell Int. Sci. Center, Thousand Oaks, CA, USA; |
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Abstract: | The authors report a novel noninterfering and simple approach for evaluation of circuits implemented with AlGaAs/GaAs heterojunction bipolar transistors (HBTs). This method makes use of radiative recombination in the base region of current-carrying HBTs. The infrared radiation emitted is 'visible' to the closed-circuit TV (CCTV) cameras. Therefore, one can view the operation of the HBT circuit under test at normal biases with a TV monitor. This method can be used to determine logic states of gates, as well as collector current of individual HBTs within integrated circuits.<> |
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