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Noninterfering optical method of HBT circuit evaluation
Authors:Wang   K.C. Asbeck   P.M. Chang   M.F. Sullivan   G.J. Miller   D.L. Basit   H.F.
Affiliation:Rockwell Int. Sci. Center, Thousand Oaks, CA, USA;
Abstract:The authors report a novel noninterfering and simple approach for evaluation of circuits implemented with AlGaAs/GaAs heterojunction bipolar transistors (HBTs). This method makes use of radiative recombination in the base region of current-carrying HBTs. The infrared radiation emitted is 'visible' to the closed-circuit TV (CCTV) cameras. Therefore, one can view the operation of the HBT circuit under test at normal biases with a TV monitor. This method can be used to determine logic states of gates, as well as collector current of individual HBTs within integrated circuits.<>
Keywords:
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