A new empirical large-signal model for enhancement-mode AlGaAs/InGaAs pHEMTs

We propose a new large-signal model for AlGaAs/InGaAs pHEMTs, which can simulate the device microwave output power, non-linear characteristics at arbitrary bias points. This model includes a new drain current equation, which is extracted from its derivatives. In addition, gate-to-source and gate-to-drain capacitances are also characterized versus the function of gate and drain biases. The parameter extraction procedure is addressed for the enhancement-mode pHEMTs, which offers an attractive solution for handset power amplifier application because of its positive bias characteristics. Finally, measured and model-predicted dc I–V, S-parameters, and power performance have been compared.