| X射线衍射在材料结构表征中的应用 |
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| 引用本文： | 马礼敦. X射线衍射在材料结构表征中的应用[J]. 理化检验(物理分册), 2009, 0(8): 501-510 |
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| 作者姓名： | 马礼敦 |
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| 作者单位： | 复旦大学分析测试中心,上海200433 |
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| 摘 要： | 扼要介绍了单晶、多晶、表面及薄膜衍射等各种技术在三个层次（多晶聚集态结构、分子与晶体结构和晶体内微结构）的材料结构表征中的应用。还从衍射仪种类、主要组成部件和重要附件三个方面介绍了X射线衍射试验装置。
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| 关 键 词： | X射线衍射 结构表征 衍射装置 |
Application of X-ray Diffraction in Characterization of Material Structure |
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| MA Li-dun. Application of X-ray Diffraction in Characterization of Material Structure[J]. Physical Testing and Chemical Analysis Part A:Physical Testing, 2009, 0(8): 501-510 |
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| Authors: | MA Li-dun |
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| Affiliation: | MA Li-dun (Centre for Analysis and Measurements, Fudan University, Shanghai 200433, China) |
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| Abstract: | The structural characterization of polycrystalline materials, molecule and crystal structure, micro- structure in crystal by X-ray single crystal diffraction, polycrystalline diffraction, surface and film diffraction and other techniques were reviewed. The main assemblies of diffractometers, the types of diffractometer and some important attachments were introduced yet. |
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| Keywords: | X-ray diffraction structural characterization diffractometer |
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