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基于小样本度量迁移学习的表面缺陷检测
引用本文:黄健,郑春厚,章军,王兵,陈鹏.基于小样本度量迁移学习的表面缺陷检测[J].模式识别与人工智能,2021,34(5):407-414.
作者姓名:黄健  郑春厚  章军  王兵  陈鹏
作者单位:安徽大学计算机科学与技术学院合肥 230601;安徽大学电气工程与自动化学院合肥 230601;安徽工业大学电气与信息工程学院马鞍山 243032;安徽大学互联网学院合肥 230601
基金项目:国家自然科学基金项目(No.62072002,U19A2064,61872004)
摘    要:将小样本学习中的度量学习方法引入缺陷检测领域,提出小样本度量迁移学习方法,用于解决深度学习方法中需要大量学习样本的问题.方法主要分为两个阶段:第一阶段使用公开或便于获得的大型数据集预训练深度网络;第二阶段将网络学习到的相关知识通过度量学习模块迁移到表面缺陷检测领域.实验表明,小样本学习在缺陷检测领域的可行性.

关 键 词:深度学习  小样本学习  度量学习  缺陷检测
收稿时间:2021-02-25

Few-Shot Metric Transfer Learning Network for Surface Defect Detection
HUANG Jian,ZHENG Chunhou,ZHANG Jun,WANG Bing,CHEN Peng.Few-Shot Metric Transfer Learning Network for Surface Defect Detection[J].Pattern Recognition and Artificial Intelligence,2021,34(5):407-414.
Authors:HUANG Jian  ZHENG Chunhou  ZHANG Jun  WANG Bing  CHEN Peng
Affiliation:1. School of Computer Science and Technology, Anhui University, Hefei 230601;
2. School of Electrical Engineering and Automation, Anhui University, Hefei 230601;
3. School of Electrical and Information Engineering, Anhui University of Technology, Maanshan 243032;
4. School of Internet, Anhui University, Hefei 230601
Abstract:Metric learning method of few-shot learning is introduced into the field of defect detection, and a few-shot learning method based on transfer metric learning is proposed to meet the requirement of deep learning method for a large number of learning samples. In the first stage, the deep network is pre-trained on the large datasets which are open or easy to be obtained. In the second stage, the relevant knowledge learned by the network is transferred to the field of surface defect detection through the metric learning module.Experiments show the feasibility of few-shot learning in defect detection.
Keywords:Deep Learning  Few-Shot Learning  Metric Learning  Defect Detection  
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