| 金薄膜UV透过特性对MCP电子增益测量影响的研究 |
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| 引用本文： | 李野,但唐仁,高延军,程轶,姜得龙,田景全.金薄膜UV透过特性对MCP电子增益测量影响的研究[J].红外技术,2002,24(3):31-33,37. |
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| 作者姓名： | 李野 但唐仁 高延军 程轶 姜得龙 田景全 |
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| 作者单位： | 长春光学精密机械学院,吉林,长春,130022 |
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| 摘 要： | 介绍了微通道板的电子增益及其测量的UV光电法，并着重分析了UV光透过Au薄膜引起的附加输出（或附加增益）对测试结果的影响，给出了减小的途径，指出了应用前景。
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| 关 键 词： | 微通道板 电子增益 UV光电法 UV透过率 金薄膜 MCP |
| 文章编号： | 1001-8891(2002)03-0031-03 |
Effects of Metallic Film UV Transmittance on Electron Gain of MCP |
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| LI Ye,DAN Tang ren,GAO Yan jun,CHENG Yi,JIANG De long,TIAN Jing quan.Effects of Metallic Film UV Transmittance on Electron Gain of MCP[J].Infrared Technology,2002,24(3):31-33,37. |
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| Authors: | LI Ye DAN Tang ren GAO Yan jun CHENG Yi JIANG De long TIAN Jing quan |
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| Abstract: | The test theorems of UV photoelectric method and electron gain of microchannel plates were intriducde. The offects of additional output or gains caused by UV light transmimitting Au thin film on the test results were mainly analyzed. Finally, we point out the approaches decreasing the affects and propose the application prospects. |
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| Keywords: | MCP electron gain UV photoelectric method UV transmimittance |
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