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| 波长色散X射线荧光分析的新发展 | |
| 引用本文： | 安国玉.波长色散X射线荧光分析的新发展[J].现代仪器,2002,8(4):40-43. |
| 作者姓名： | 安国玉 |
| 作者单位： | 岛津科学仪器中心,北京,100029 |
| 摘 要： | 本文从硬件的改进、分析能力的提高、分析方法的完善及应用领域的扩展等几个方面介绍了波长色散型X射线荧光光谱仪的发展现状。 |
| 关 键 词： | X射线荧光光谱仪 微区成像 高级次谱线 薄膜分析 基本参数法 |
Development of wavelength dispersive X-ray fluorescence analysis |
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| An Guoyu.Development of wavelength dispersive X-ray fluorescence analysis[J].Modern Instruments,2002,8(4):40-43. | |
| Authors: | An Guoyu |
| Abstract: | Based on the improvement of hardware, increasement of analytical capability, perfection of analytical methodes and enlargement of application fields, this paper described the current status and development of X-ray fluorescent spectroscope of wave-length dispersion model. |
| Keywords: | X-ray fluorescence spectroscope Micro-area elemental imaging High order spectrum analysis Thin film analysis Fundamental parameter (FP) method Extend X-ray Emission Fine Structure (EXEFS) |
| 本文献已被 CNKI 维普 万方数据 等数据库收录！ | |