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三氧化钨薄膜的红外发射率调制技术
引用本文:路远,冯万鼎,乔亚.三氧化钨薄膜的红外发射率调制技术[J].红外与激光工程,2011,40(7):1221-1224.
作者姓名:路远  冯万鼎  乔亚
作者单位:脉冲功率激光技术国家重点实验室,安徽合肥,230037
基金项目:安徽省红外与低温等离子体重点实验室基金(2010A001004D)
摘    要:研究了利用载流子对材料表面的红外发射率进行调制的方法.根据电磁波理论,讨论了物体表面的发射率与折射率的关系,折射率大的物体发射率低.物质的折射率与其中的载流子浓度有关,通过控制载流子的浓度可以对材料的发射率进行调制.以磁控溅射方法在ITO玻璃上制备了氧化钨薄膜.利用电化学方法对三氧化钨薄膜进行了H+离子和电子的注入和抽...

关 键 词:红外发射率  折射率  调制  三氧化钨薄膜

Infrared emissivity modulation technology of WO_3 thin film
Lu Yuan,Feng Wanding,Qiao Ya.Infrared emissivity modulation technology of WO_3 thin film[J].Infrared and Laser Engineering,2011,40(7):1221-1224.
Authors:Lu Yuan  Feng Wanding  Qiao Ya
Affiliation:Lu Yuan,Feng Wanding,Qiao Ya(State Key Laboratory of Pulsed Power Laser Technology,Hefei 230037,China)
Abstract:The infrared emissivity modulation method by controlling the carriers in material was studied.Based on the theory of electromagnetic wave,the relationship between emissivity and refractive index was discussed.The object with higher refractive index had lower emissivity.The refractive index of a material had relationship with the carrier concentration in it.The emissivity of material could be modulated by controlling the carrier concentration.Magnetron sputtering method was used to prepare WO3 thin film on I...
Keywords:infrared emissivity  refractive index  modulation  WO3 thin film  
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