A method to evaluate mechanical performance of thin transparent films for flexible displays |
| |
Authors: | Sonia Grego Jay Lewis Erik Vick Dorota Temple |
| |
Affiliation: | RTI International, 3040 Cornwallis Road, PO Box 12194, Research Triangle Park, NC 27709, USA |
| |
Abstract: | Mechanical flexing of plastic substrates coated with thin film permeation barriers causes stress-induced cracks that may lead to device degradation. This phenomenon is of particular importance for organic light emitting diodes, an emerging display technology that can be implemented on flexible substrates but imposes stringent requirements on the barrier performance. We demonstrate a dry-etch-based method to highlight cracks in thin films of transparent materials and make them visible under a conventional optical microscope on samples in a neutral, relaxed position. This approach allows for rapid evaluation of the mechanical performance of thin film barriers on flexible substrates. |
| |
Keywords: | Etching Polymers Stress Silicon oxide |
本文献已被 ScienceDirect 等数据库收录! |