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Estimates of interfacial properties in Cu/Ni multilayer thin films using hardness data
Authors:P.M. Anderson  J.S. Carpenter
Affiliation:1. Institute of Materials Engineering, National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences, Nanjing University, Jiangsu, People''s Republic of China;2. Department of Physics, School of Science, Linyi University, Shandong, People''s Republic of China;1. Institute for Materials Physics, Georg-August-University Göttingen, Friedrich-Hund-Platz 1, D-37077 Göttingen, Germany;2. Institute for Applied Materials, Karlsruhe Institute of Technology, Hermann-von-Helmholtz-Platz 1, D-76344 Eggenstein-Leopoldshafen, Germany;3. MINES ParisTech, Centre des Matériaux, CNRS UMR 7633, BP 87, 91003 Evry Cedex, France;4. Institute of Materials Research, Materials Mechanics, Helmholtz-Zentrum Geesthacht, Max-Planck-Straße 1, D-21502 Geesthacht, Germany;1. Theoretical Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA;2. Materials Physics and Application Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA;3. Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, NM 87545, USA;1. School of Mechanical and Materials Engineering, Washington State University, USA;2. School of Materials Engineering, Purdue University, USA;1. Purdue University, West Lafayette, IN 47907, USA;2. Los Alamos National Laboratory, Los Alamos, NM 87545, USA
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