| 微波暗室反射率电平对微波场强校准的影响 |
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| 引用本文： | 朱传焕.微波暗室反射率电平对微波场强校准的影响[J].计测技术,2008,28(4). |
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| 作者姓名： | 朱传焕 |
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| 作者单位： | 中国船舶重工集团公司第七0一研究所,湖北武汉430064 |
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| 摘 要： | 论述了微波暗室静区反射率电平的测量方法和微波场强校准原理，分析了反射率电平对标准场法微波场强校准的影响。
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| 关 键 词： | 微波暗室 反射率电平 场强 校准 |
Influence of Reflectance Level at Calibrating Microwave Field Strength in Microwave Anechoic Chamber |
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| ZHU Chuan-huan.Influence of Reflectance Level at Calibrating Microwave Field Strength in Microwave Anechoic Chamber[J].Metrology & Measurement Technology,2008,28(4). |
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| Authors: | ZHU Chuan-huan |
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| Abstract: | It discusses the method for measuring reflectance level and the principle for calibrating microwave field strength in the quiet zone of microwave anechoic chamber,and analyes the influence of reflectance level at calibrating microwave field strength using the method of standard field. |
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| Keywords: | microwave anechoic chamber reflectance level field strength calibrate |
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