| 量子阱材料的电子显微镜及光致发光研究 |
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| 引用本文： | 范缇文,张永航,曾一平,陈良惠,徐统. 量子阱材料的电子显微镜及光致发光研究[J]. 半导体学报, 1990, 11(9): 706-708 |
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| 作者姓名： | 范缇文 张永航 曾一平 陈良惠 徐统 |
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| 作者单位： | 中国科学院半导体研究所，中国科学院半导体研究所，中国科学院半导体研究所，中国科学院半导体研究所，美国犹他大学材料科学和工程系 北京 中国科学院北京电子显微镜实验室，北京，北京，北京 |
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| 摘 要： | 对GaAs/Al_xGa_(1-x)As量子阱材料进行的光致发光(PL),横断面透射电子显微镜(XTEM)和反射电子显微镜(REM)的研究结果表明量子阱材料的结构质量对其光电性能有一定影响。另外,也观察到分子束外延对改进异质结界面的平整度有明显作用。
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| 关 键 词： | 量子阱材料 电子显微镜 光致发光 |
Electron Microscopy and Photoluminescence Studies of GaAs/Al_xGa_(1-x)As Quantum wells |
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| Fan Tiwen/Institute ot Semiconductors,Academia Sinica China,Beijing Laboratory of Electron Microscopy,Academia Sinica ChinaZhang Yonghang/Institute ot Semiconductors,Academia Sinica ChinaZeng Yiping/Institute ot Semiconductors,Academia Sinica ChinaChen Lianghui/Institute ot Semiconductors,Academia Sinica ChinaHsu Tung/. Electron Microscopy and Photoluminescence Studies of GaAs/Al_xGa_(1-x)As Quantum wells[J]. Chinese Journal of Semiconductors, 1990, 11(9): 706-708 |
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| Authors: | Fan Tiwen/Institute ot Semiconductors Academia Sinica China Beijing Laboratory of Electron Microscopy Academia Sinica ChinaZhang Yonghang/Institute ot Semiconductors Academia Sinica ChinaZeng Yiping/Institute ot Semiconductors Academia Sinica ChinaChen Lianghui/Institute ot Semiconductors Academia Sinica ChinaHsu Tung/ |
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| Affiliation: | Fan Tiwen/Institute ot Semiconductors,Academia Sinica China,Beijing Laboratory of Electron Microscopy,Academia Sinica ChinaZhang Yonghang/Institute ot Semiconductors,Academia Sinica ChinaZeng Yiping/Institute ot Semiconductors,Academia Sinica ChinaChen Lianghui/Institute ot Semiconductors,Academia Sinica ChinaHsu Tung/Department of Materials Sciences and Engineering,University of Utah,USA |
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| Abstract: | Using XTEM, REM and PL, the effect of structural quality on the optoelectronic properties of GaAs/Al_xGa_(1-x)As quantum wells grown by MBE has been studied. In addition, theexperimental results reveal that the flatness of interfaces in heterostructures can be improvedby MBE technique. |
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| Keywords: | Quantum well Molecular beam epitaxy Photoluminescence Electron microscopy Interface |
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