|
|||||
|
|
Characterization of SWCNT and PAN/SWCNT films |
|
| Authors: | S Bellayer JW Gilman SS Rahatekar S Bourbigot LM Hanssen S Kumar |
| Affiliation: | a PERF of Ecole Nationale Supérieure de Chimie de Lille, BP108, 59652 Villeneuve d’Ascq Cedex, France b National Institute of Standards and Technology, 100 Bureau Drive, Gaithersburg, MD 20899, USA c Laboratory ENSAIT-GEMTEX, 9, rue de l’Ermitage - BP 30.329 59056 Roubaix Cedex 01, France d Georgia Institute of Technology, 801 Ferst Drive, Atlanta, GA, 30332-0295, USA |
| Abstract: | Three different films, poly(acrylonitrile-co-methylacrylate)/single wall carbon nanotubes (PAN-MA/SWCNT), poly(acrylonitrile-co-methylacrylate)/carbon black (PAN-MA/CB) and pure functionalized SWCNT, are analyzed. The diffuse reflectance and transmittance of the films from 2 μm to 18 μm are characterized with an integrating-sphere Fourier transform spectrophotometer system. The SWCNT film shows high reflectance and low emissivity. Surface roughness characterization by laser scanning confocal microscopy confirms that the low emissivity is not due to a highly polished surface and is therefore more likely due to the metallic behavior of the SWCNTs. Characterization using infra red thermography highlighted the thermal protective behavior of the SWCNT film; the maximum temperature obtained from a 5.2 kW/m2 heat flux exposure was 50 °C lower than that for the two (SWCNT, CB) PAN-MA based films. |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ | |