A new method for measurement of threshold voltage non-uniformity in CCD multiplexers for hybrid focal plane arrays

A new, simple and rapid method for determining threshold voltage (V_T) non-uniformity in two-dimensional CCD multiplexers (MUXs) for hybrid focal plane arrays is presented. The method is based on simple oscilloscopic measurement of non-uniformity in the output signal of CCD MUX. The non-uniformity in V_T, measured by this method, is compared with conventional current forcing method. The results of the proposed new method agree within 7.8% with the conventional method. Additionally, intrinsic non-uniformity due to processing and material variations is also measured by this method.