Interface morphology snapshots of vertically segregated thin films of semiconducting polymer/polystyrene blends |
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Authors: | Fernando A Castro Carlos FO Graeff Roland Hany |
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Affiliation: | a Empa, Swiss Federal Laboratories for Materials Testing and Research, Laboratory for Functional Polymers, Überlandstr. 129, CH-8600 Dübendorf, Switzerland b Departamento de Física e Matemática - Faculdade de Filosofia, Ciências e Letras de Ribeirão Preto - Universidade de São Paulo, Av. Bandeirantes 3900, 14040-901 Ribeirão Preto - SP, Brazil c Departamento de Física, Faculdade de Ciências, UNESP, Av. Luiz Edmundo Carrijo Coube 14-01, 17033-360 Bauru, Brazil |
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Abstract: | We present atomic force microscopic images of the interphase morphology of vertically segregated thin films spin coated from two-component mixtures of poly2-methoxy-5-(2′-ethylhexyloxy)-1,4-phenylene-vinylene] (MEH-PPV) and polystyrene (PS). We investigate the mechanism leading to the formation of wetting layers and lateral structures during spin coating using different PS molecular weights, solvents and blend compositions. Spinodal decomposition competes with the formation of surface enrichment layers. The spinodal wavelength as a function of PS molecular weight follows a power-law similar to bulk-like spinodal decomposition. Our experimental results indicate that length scales of interface topographical features can be adjusted from the nanometer to micrometer range. The importance of controlled arrangement of semiconducting polymers in thin film geometries for organic optoelectronic device applications is discussed. |
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Keywords: | Polymer demixing Polymer blends MEH-PPV |
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