A Monte Carlo model for studying the microheterogeneity of trace elements in reference materials by means of synchrotron microscopic X-ray fluorescence

Synchrotron micro-XRF, a trace-level microanalytical method, allows quantitative study of the nature and degree of heterogeneity of inorganic trace constituents in solid materials with a homogeneous matrix. In this work, the standard reference materials NIST SRM 613, Trace Elements in 1 mm Glass Wafers, and NIST SRM 1577a, Trace Elements in Bovine Liver, are examined at the 10100-ng mass level using X-ray beams of 5-150 microm in diameter. A procedure based on a large number of repeated analyses of small absolute amounts of the SRMs allows calculation of the minimal representative mass of the standard. The microheterogeneity of both NIST SRM 613 and NIST SRM 1577a was investigated with the aim of evaluating their suitability as reference materials for trace-level microanalytical techniques. A Monte Carlo simulation model was constructed for both homogeneous and heterogeneous materials to elucidate the dependence of the calculated minimal representative mass on the total analyzed mass in the case of materials that showstrongly heterogeneous features at the microscopic level.