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Molecular Electronics: The Drive Force of Electrical Breakdown of Large‐Area Molecular Tunnel Junctions (Adv. Funct. Mater. 28/2018) |
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| Authors: | Li Yuan Li Jiang Christian A. Nijhuis |
| Affiliation: | Department of Chemistry, Centre for Advanced 2D Materials, NUSNNI‐Nanocore, National University of Singapore, Singapore, Singapore |
| Abstract: | |
| Keywords: | electrical breakdown electromigration molecular electronics tunnel junction wind force |