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Development and prospect of near-field optical measurements and characterizations
Authors:Jia WANG    Qingyan WANG    Mingqian ZHANG
Affiliation:State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instruments,Tsinghua University, Beijing 100084, China
Abstract:
Keywords:scanning near-field optical microscopy (SNOM)  near-field optical (NFO) measurement  superresolution imaging  near-field spectroscopy  nano-optics,nanophotonics
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