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柔性ITO衬底上铜酞菁薄膜有序生长的X射线衍射研究
引用本文:梁氏秋水,陈振兴,朱宏伟,盛勇,胡豫. 柔性ITO衬底上铜酞菁薄膜有序生长的X射线衍射研究[J]. 化工新型材料, 2009, 37(11)
作者姓名:梁氏秋水  陈振兴  朱宏伟  盛勇  胡豫
作者单位:中山大学化学与化学工程学院,广州,510275;中山大学化学与化学工程学院,广州,510275;中山大学化学与化学工程学院,广州,510275;中山大学化学与化学工程学院,广州,510275;中山大学化学与化学工程学院,广州,510275
基金项目:国家自然科学基金资助项目,广东省自然科学基金资助项目 
摘    要:采用石英晶体微天平实时监测薄膜生长速率,通过控制衬底温度与薄膜生长速率,在柔性ITO导电衬底上真空蒸发沉积了铜酞菁薄膜.X射线衍射分析表明,适当提高衬底温度与薄膜生长速率,可促进薄膜的有序生长.当衬底温度为90℃,生长速率为10nm/min时,薄膜的有序度最高,薄膜晶型呈(相和(200)晶面.

关 键 词:铜酞菁  X射线衍射  柔性衬底  真空蒸发沉积  有序薄膜

X-ray diffraction investigations of well-ordered copper phthalocyanine films deposited on flexible ITO substrate
Liangshi Qiushui,Chen Zhenxing,Zhu Hongwei,Sheng Yong,Hu Yu. X-ray diffraction investigations of well-ordered copper phthalocyanine films deposited on flexible ITO substrate[J]. New Chemical Materials, 2009, 37(11)
Authors:Liangshi Qiushui  Chen Zhenxing  Zhu Hongwei  Sheng Yong  Hu Yu
Abstract:Through controlling substrate temperature and growth rate detected by quartz crystal microbalance meas-urement, CuPc films were deposited on flexible ITO substrate. X-ray diffraction investigation shown that the growth of CuPc films were strongly affected by substrate temperature and growth rate. Well-ordered CuPe film could be deposited at substrate temperature 90℃ and growth rate 10nm/min. Crystal structure of the as-prepared CuPc film was existed as (phase and (200) plane.
Keywords:copper phthalocyanine  X-ray diffraction  flexible substrate  vacuum evaporation deposition  well-or-dered film
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