| 基于光腔衰荡的反射率测量技术的研究 |
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| 引用本文： | 孙宏波,熊胜明,高丽峰. 基于光腔衰荡的反射率测量技术的研究[J]. 光学仪器, 2004, 26(2): 174-177 |
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| 作者姓名： | 孙宏波 熊胜明 高丽峰 |
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| 作者单位： | 中国科学院光电技术研究所,四川,成都,610209;中国科学院光电技术研究所,四川,成都,610209;中国科学院光电技术研究所,四川,成都,610209 |
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| 摘 要： | 根据光腔衰荡原理开展了高反射率镜片反射率测量技术的研究。理论上给出了直型腔和折叠腔的反射率计算方法,构建了测量高反镜反射率的实验系统。实验结果表明系统结构简单,易调节,可以测量任意角度的反射率,测量结果精确,可满足高反镜片的各种测量要求。
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| 关 键 词： | 光腔衰荡(CRD) 反射率 测量技术 |
| 文章编号： | 1005-5630(2004)02-0174-04 |
| 修稿时间： | 2003-11-30 |
Reflectance determination based on cavity ringdown |
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| SUN Hong-bo,XIONG SHeng-ming,GAO Li-feng. Reflectance determination based on cavity ringdown[J]. Optical Instruments, 2004, 26(2): 174-177 |
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| Authors: | SUN Hong-bo XIONG SHeng-ming GAO Li-feng |
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| Abstract: | The research on high reflectivity mirror reflectivity measurement system was developed according to cavity ringdown theory. The theoretical basis of mirror reflectance determination based on cavity ringdown is introduced and a experiments setup was developed. The results show that this technique has simple setup, high-sensitivity and can apply for measurement of many high reflectance mirror. |
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| Keywords: | cavity ringdown (CRD) reflectance measurement technology |
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