QFN芯片表面划痕检测定位方法设计

在工业应用中,需要对方形扁平无引脚封装(Quad flat no-lead package, QFN)芯片表面划痕实时 准确检测,提出了一种快速的芯片表面划痕检测定位方法。通过图像分割算法获取缺陷图像,结合 轮廓提取算法可以较好地实现芯片表面划痕定位。同时,为了保证对芯片表面划痕实时检测,采用 基于粒子群的Otsu多阈值算法进行图像分割,不仅使得图像中缺陷区域更加明显,而且缩短了芯片 表面划痕检测时间。与直接采用Otsu算法相比,芯片表面划痕检测时间由秒级缩短至毫秒级,提高 了芯片质量检测效率。该划痕快速定位检测方法对芯片检测设备软件系统开发与应用具有重要的参考价值。

Method of Surface Scratch Detection and Location of QFN Chip

In industrial applications, it is necessary to accurately detect scratches on the surface of a quad flat no-lead package (QFN) chip in real time. A rapid chip surface scratch detection and location method was proposed. According to image segmentation algorithm, a defect image can be acquired firstly. Then by combining with the contour extraction algorithm, the chip surface scratch location can be achieved. At the same time, in order to ensure real-time detection of scratches on the chip surface, image segmentation is further completed by using the Otsu multi-threshold algorithm based on particle swarm optimization (PSO) algorithm, which not only makes the defect area in the image more obvious, but also shortens the scratch detection time on the chip surface. Compared with the direct use of the Otsu algorithm, the scratch detection time on the chip surface is reduced from seconds to milliseconds, and the chip quality detection efficiency has been improved greatly. It is shown that the method has important reference value for the development and application of software systems for chip detection equipment.