| 电荷放大器可靠性分析 |
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| 引用本文： | 魏冬,张志杰,裴东兴.电荷放大器可靠性分析[J].中国测试技术,2007,33(1):86-87. |
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| 作者姓名： | 魏冬 张志杰 裴东兴 |
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| 作者单位： | 中北大学仪器科学与动态测试教育部重点实验室,山西,太原,030051 |
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| 摘 要： | 介绍了电荷放大器在存储测试系统中的作用,详细说明了电荷放大器工作原理,推导出电荷量与输出电压之间的关系。通过故障树的方法对电荷放大器的可靠性进行分析,得出电荷放大器的MTBF和可靠性曲线,定量计算出电阻、电容、焊点和芯片在一个完整的存储测试电路中的失效率,定性的分析出不同部分对整体系统失效率的影响度。
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| 关 键 词： | 电荷放大器 可靠性 失效率 故障树 |
| 文章编号： | 1672-4984（2007）01-0086-02 |
| 修稿时间： | 2006-04-08 |
Reliability-analysis of charge amplifier |
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| WEI Dong,ZHANG Zhi-jie,PEI Dong-xing.Reliability-analysis of charge amplifier[J].China Measurement Technology,2007,33(1):86-87. |
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| Authors: | WEI Dong ZHANG Zhi-jie PEI Dong-xing |
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| Affiliation: | Key Laboratory of Instrumentation Science and Dyamic Measurement(Ministry of Education |
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| Abstract: | This paper introduced the function and operating principle of charge amplifier in the stored testing and measuring system and then derived the relation of charge and output-voltage.The reliability of charge amplifier was analyzed by fault tree.The MTBF and reliability-curve of charge amplifier was obtained.The miss ratio to a whole stored testing and measuring system of resistance,capacitance,weld and CMOS chip was calculated.The influence of difference parts to the miss ratio of whole system was analyzed qualitatively. |
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| Keywords: | MTBF |
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