Microwave dielectric properties of LaMgAl11O19

The suitable choice of a substrate material is one of the aims to be fulfilled in high speed microwave technology. LaMgAl₁₁O₁₉ oxide ceramic material, which belongs to the magnetoplumbite family, has been reported earlier as a potential candidate for such applications. This material has been prepared by conventional solid-state ceramic route. The structure has been studied by X-ray diffraction and characterized at microwave frequencies. The effect of dopant and glass addition on the microwave dielectric properties of this material has also been investigated. LaMgAl₁₁O₁₉ has relatively low dielectric constant (ε_r=14), low dielectric loss or high quality factor (Q_u×f>28,000 GHz at 7 GHz) and small temperature variation of resonant frequency (τ_f=−12 ppm/°C) at room temperature (300 K). These properties make LaMgAl₁₁O₁₉ as a good substrate material and as a dielectric resonator to be used in microwave devices operating at relatively high frequencies.