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Fractal nature of crystalline-crystalline interface in CuInSe2 thin films |
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| Authors: | P MalarS Kasiviswananthan Ram DevanathanV Damodara Das |
| Affiliation: | a Thin Film Laboratory, Department of Physics, Indian Institute of Technology Madras, Chennai 600036, India b Transmission Electron Microscopy Laboratory, Department of Metallurgy, Indian Institute of Technology Madras, Chennai 600036, India |
| Abstract: | The characteristics of sub-micron scale crystalline-crystalline interface roughness in CuInSe2 thin films have been studied using transmission electron microscopy. The interface is formed by local recrystallization of CuInSe2 films using electron beam irradiation in a transmission electron microscope. Analysis of the interface data obtained from the electron micrographs suggested that the interface shows self-affine fractal scaling with a static scaling exponent of 0.97±0.02. |
| Keywords: | A. Semiconductors A. Thin films B. Vapor deposition C. Electron microscopy D. Microstructure |
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