首页 | 本学科首页   官方微博 | 高级检索  
     

固液界面附近CdZnTe晶体组份分布及X-Ray测试
引用本文:涂步华,方维政,刘从峰,孙士文,杨建荣,何力. 固液界面附近CdZnTe晶体组份分布及X-Ray测试[J]. 激光与红外, 2005, 35(11): 853-856
作者姓名:涂步华  方维政  刘从峰  孙士文  杨建荣  何力
作者单位:中国科学院上海技术物理研究所,功能材料与器件研究中心,上海,200083;中国科学院上海技术物理研究所,功能材料与器件研究中心,上海,200083;中国科学院上海技术物理研究所,功能材料与器件研究中心,上海,200083;中国科学院上海技术物理研究所,功能材料与器件研究中心,上海,200083;中国科学院上海技术物理研究所,功能材料与器件研究中心,上海,200083;中国科学院上海技术物理研究所,功能材料与器件研究中心,上海,200083
基金项目:国家自然科学基金项目(No.50276036).
摘    要:利用对垂直布里奇曼Bridgman法生长中的Cd1-xZnxTe晶体停电自然降温的方法获得了具有不同凝固速率的同一块单晶样品.通过红外透射光谱测量方法对停电自然降温前后的单晶区域进行比较,结果显示:停电自然降温后,在固液界面附近存在一个明显的组份过度区,正常凝固的晶体组份分布比较均匀,而快速凝固的结晶区域轴向组份分布梯度较大,同时,通过X-Ray测试结果进一步准确判断固液界面的位置.

关 键 词:Cd1-xZnxTe  快速降温  Zn组份  X-Ray
文章编号:1001-5078(2005)11-0853-04
收稿时间:2005-08-26
修稿时间:2005-08-26

The Concentration Distribution and X-Ray Measurement of Nearby the Cd1 -xZnxTe Solid-liquid Interface
TU Bu-hua,FANG Wei-zheng,LIU Cong-feng,SUN Shi-wen,YANG Jian-rong,HE Li. The Concentration Distribution and X-Ray Measurement of Nearby the Cd1 -xZnxTe Solid-liquid Interface[J]. Laser & Infrared, 2005, 35(11): 853-856
Authors:TU Bu-hua  FANG Wei-zheng  LIU Cong-feng  SUN Shi-wen  YANG Jian-rong  HE Li
Affiliation:Research Center for Advance Materials and Devices, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai 200083, China
Abstract:Cd1-xZn, Te single crystal with different growth rate was obtained by suddenly power off during vertical Bridgman growth process. The properties of the crystal were investigated by measurement of IR transmission spectrum. The result indicates that an obvious transition area of Zn concentration nearby the solid-liquid interface just before rapid cooling was observed. The distribution of crystal concentration that cooled in normal condition is comparative symmetrical, while the grads of axes oriental concentration distribution that revealed in quick cooling crystal area is bigger. Meanwhile, we can further judge the position of solid-liquid interface by the result of X-Ray Measurement.
Keywords:Cd1-xZn, Te   suddenly cool    Zn concentration    X-ray
本文献已被 CNKI 维普 万方数据 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号