Resonance methods for microwave studies of dielectrics (Review)

The general properties of microwave resonators with dielectric inclusions, which are important in dielectric measurements, are described. The methods for measuring the permittivity and dielectric losses in isotropic and uniaxial dielectrics with the use of cavity, open, and dielectric resonators are considered. Approximations that are often used in the theory and practice of measurements and limit accuracy are analyzed. The formulas used in calculations and results of measurements of the dielectric parameters of various samples, including films, coatings, and substrates, in the range 1.5–75.0 GHz are presented. The possibilities of local measurements and measurements of parameters of media are discussed.