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应用改进的热场生长低位错SI-CaAs单晶
引用本文:谢自力,夏德谦,陈宏毅,朱志明.应用改进的热场生长低位错SI-CaAs单晶[J].固体电子学研究与进展,1992(3).
作者姓名:谢自力  夏德谦  陈宏毅  朱志明
作者单位:南京电子器件研究所 210016 (谢自力,夏德谦,陈宏毅),南京电子器件研究所 210016(朱志明)
摘    要:报道在国产JW一0002型高压单晶炉内设计了一种改进的LEC热场装置,改善了加热区的温度分布,使炉内覆盖剂B_2O_3的轴向温度梯度减少到30~60℃/cm,拉制的φ50mm,<100>晶向的SI—GaAs单晶,其位错密度低于5×10~3cm~(-2),局部无位错。

关 键 词:热场  温度梯度  位错密度  半绝缘砷化镓

Semi-insulating GaAs Crystals with Low Dislocation Density Grown by Modified Heating System
Xie Zili,Xia Deqian.Chen Hongyi,Zhu Zhiming.Semi-insulating GaAs Crystals with Low Dislocation Density Grown by Modified Heating System[J].Research & Progress of Solid State Electronics,1992(3).
Authors:Xie Zili  Xia DeqianChen Hongyi  Zhu Zhiming
Abstract:This paper describes a LEC thermal field apparatus with improved effective thermal configuration in JW-0002 type high pressure pulling system. The axial temperature gradient between the coating material B2O3 and GaAs melt is reduced to 30-60/cm. The <100> dislocation densities of the grown semi-insulating GaAs single crystals with a diameter of 50 mm are less than 5X103/cm2 and free in some regions.
Keywords:Thermal Field  Temperature Gradients  Dislocation Densities  Si-GaAs
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