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A Supercritical Lens Optical Label‐Free Microscopy: Sub‐Diffraction Resolution and Ultra‐Long Working Distance |
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| Authors: | Fei Qin Kun Huang Jianfeng Wu Jinghua Teng Cheng‐Wei Qiu Minghui Hong |
| Affiliation: | 1. Department of Electrical and Computer Engineering, National University of Singapore, Singapore, Singapore;2. Institute of Materials Research and Engineering, Agency for Science Technology and Research (A*STAR), Singapore, Singapore;3. Department of Physics, National University of Singapore, Singapore, Singapore |
| Abstract: | |
| Keywords: | far‐field label‐free optical imaging planar lens super‐resolution |